{"page":"1957-1959","publication_identifier":{"eissn":["1077-3118"],"issn":["0003-6951"]},"author":[{"orcid":"0000-0002-6391-6548","id":"35809","last_name":"Schröder","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0002-6391-6548/work/96660451","full_name":"Schröder, Christian","first_name":"Christian"},{"full_name":"Heiland, W.","first_name":"W.","last_name":"Heiland"},{"last_name":"Held","first_name":"R.","full_name":"Held, R."},{"first_name":"W.","full_name":"Loose, W.","last_name":"Loose"}],"language":[{"iso":"eng"}],"doi":"10.1063/1.115638","citation":{"apa":"Schröder, C., Heiland, W., Held, R., &#38; Loose, W. (1996). Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes. <i>Applied Physics Letters</i>, <i>68</i>(14), 1957–1959. <a href=\"https://doi.org/10.1063/1.115638\">https://doi.org/10.1063/1.115638</a>","short":"C. Schröder, W. Heiland, R. Held, W. Loose, Applied Physics Letters 68 (1996) 1957–1959.","mla":"Schröder, Christian, et al. “Analysis of Reverse Current–Voltage Characteristics of Ti/6H–SiC Schottky Diodes.” <i>Applied Physics Letters</i>, vol. 68, no. 14, AIP Publishing, 1996, pp. 1957–59, doi:<a href=\"https://doi.org/10.1063/1.115638\">10.1063/1.115638</a>.","ama":"Schröder C, Heiland W, Held R, Loose W. Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes. <i>Applied Physics Letters</i>. 1996;68(14):1957-1959. doi:<a href=\"https://doi.org/10.1063/1.115638\">10.1063/1.115638</a>","alphadin":"<span style=\"font-variant:small-caps;\">Schröder, Christian</span> ; <span style=\"font-variant:small-caps;\">Heiland, W.</span> ; <span style=\"font-variant:small-caps;\">Held, R.</span> ; <span style=\"font-variant:small-caps;\">Loose, W.</span>: Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes. In: <i>Applied Physics Letters</i> Bd. 68, AIP Publishing (1996), Nr. 14, S. 1957–1959","chicago":"Schröder, Christian, W. Heiland, R. Held, and W. Loose. “Analysis of Reverse Current–Voltage Characteristics of Ti/6H–SiC Schottky Diodes.” <i>Applied Physics Letters</i> 68, no. 14 (1996): 1957–59. <a href=\"https://doi.org/10.1063/1.115638\">https://doi.org/10.1063/1.115638</a>.","bibtex":"@article{Schröder_Heiland_Held_Loose_1996, title={Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes}, volume={68}, DOI={<a href=\"https://doi.org/10.1063/1.115638\">10.1063/1.115638</a>}, number={14}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Schröder, Christian and Heiland, W. and Held, R. and Loose, W.}, year={1996}, pages={1957–1959} }","ieee":"C. Schröder, W. Heiland, R. Held, and W. Loose, “Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes,” <i>Applied Physics Letters</i>, vol. 68, no. 14, pp. 1957–1959, 1996."},"status":"public","_id":"1456","publication_status":"published","date_created":"2021-07-06T09:07:57Z","title":"Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes","publisher":"AIP Publishing","volume":68,"user_id":"35809","publication":"Applied Physics Letters","date_updated":"2022-06-27T13:42:41Z","issue":"14","intvolume":"        68","year":"1996","quality_controlled":"1","type":"journal_article"}