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Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells

J. Weicht, F. Hamelmann, G. Behrens, in: 2016.

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Konferenzbeitrag | Englisch
Autor*in
Weicht, Johannes; Hamelmann, FrankFH Bielefeld ; Behrens, GritFH Bielefeld
Abstract
In our work we observe the temperature coefficients before and after light-induced degradation of amorphous/micro-crystalline (a-Si/μc-Si) tandem silicon-based solar cells. We show that during light-induced degradation the temperature parameters of the serial and parallel resistance, photo current and the saturation current in the diode model change: the temperature has a stronger effect after the light-induced degradation, the temperaturecoefficient of silicon-based thin film solar cells varies during the light-induced degradation.
Erscheinungsjahr
Konferenz
32nd European Photovoltaic Solar Energy Conference and Exhibition
Konferenzort
München
Konferenzdatum
2016-06-20 – 2016-06-24
ISSN
FH-PUB-ID
175

Zitieren

Weicht, Johannes ; Hamelmann, Frank ; Behrens, Grit: Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. In: , 2016
Weicht J, Hamelmann F, Behrens G. Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. In: ; 2016. doi:10.4229/EUPVSEC20162016-3DV.1.4
Weicht, J., Hamelmann, F., & Behrens, G. (2016). Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. Presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition, München. https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4
@inproceedings{Weicht_Hamelmann_Behrens_2016, title={Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells}, DOI={10.4229/EUPVSEC20162016-3DV.1.4}, author={Weicht, Johannes and Hamelmann, Frank and Behrens, Grit}, year={2016} }
Weicht, Johannes, Frank Hamelmann, and Grit Behrens. “Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells,” 2016. https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4.
J. Weicht, F. Hamelmann, and G. Behrens, “Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells,” presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition, München, 2016.
Weicht, Johannes, et al. Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells. 2016, doi:10.4229/EUPVSEC20162016-3DV.1.4.

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