On the reliability of highly magnified micrographs for structural analysis in materials science

M. Wortmann, A.S. Layland, N. Frese, U. Kahmann, T. Grothe, J.L. Storck, T. Blachowicz, J. Grzybowski, B. Hüsgen, A. Ehrmann, Scientific Reports 10 (2020).

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Artikel | Veröffentlicht | Englisch
Autor*in
Wortmann, Martin; Layland, Ashley Stephen; Frese, Natalie; Kahmann, Uwe; Grothe, TimoFH Bielefeld ; Storck, Jan LukasFH Bielefeld ; Blachowicz, Tomasz; Grzybowski, Jacek; Hüsgen, Bruno; Ehrmann, AndreaFH Bielefeld
Abstract
<jats:p>Highly magnified micrographs are part of the majority of publications in materials science and related fields. They are often the basis for discussions and far-reaching conclusions on the nature of the specimen. In many cases, reviewers demand and researchers deliver only the bare minimum of micrographs to substantiate the research hypothesis at hand. In this work, we use heterogeneous poly(acrylonitrile) nanofiber nonwovens with embedded nanoparticles to demonstrate how an insufficient or biased micrograph selection may lead to erroneous conclusions. Different micrographs taken by transmission electron microscopy and helium ion microscopy with sometimes contradictory implications were analyzed and used as a basis for micromagnetic simulations. With this, we try to raise awareness for the possible consequences of cherry-picking for the reliability of scientific literature.</jats:p>
Erscheinungsjahr
Zeitschriftentitel
Scientific Reports
Band
10
Artikelnummer
14708
ISSN
Finanzierungs-Informationen
Article Processing Charge funded by the Deutsche Forschungsgemeinschaft and the Open Access Publication Fund of LibreCat University.
FH-PUB-ID
673

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Wortmann, Martin ; Layland, Ashley Stephen ; Frese, Natalie ; Kahmann, Uwe ; Grothe, Timo ; Storck, Jan Lukas ; Blachowicz, Tomasz ; Grzybowski, Jacek ; u. a.: On the reliability of highly magnified micrographs for structural analysis in materials science. In: Scientific Reports Bd. 10 (2020)
Wortmann M, Layland AS, Frese N, et al. On the reliability of highly magnified micrographs for structural analysis in materials science. Scientific Reports. 2020;10. doi:10.1038/s41598-020-71682-8
Wortmann, M., Layland, A. S., Frese, N., Kahmann, U., Grothe, T., Storck, J. L., … Ehrmann, A. (2020). On the reliability of highly magnified micrographs for structural analysis in materials science. Scientific Reports, 10. https://doi.org/10.1038/s41598-020-71682-8
@article{Wortmann_Layland_Frese_Kahmann_Grothe_Storck_Blachowicz_Grzybowski_Hüsgen_Ehrmann_2020, title={On the reliability of highly magnified micrographs for structural analysis in materials science}, volume={10}, DOI={10.1038/s41598-020-71682-8}, number={14708}, journal={Scientific Reports}, author={Wortmann, Martin and Layland, Ashley Stephen and Frese, Natalie and Kahmann, Uwe and Grothe, Timo and Storck, Jan Lukas and Blachowicz, Tomasz and Grzybowski, Jacek and Hüsgen, Bruno and Ehrmann, Andrea}, year={2020} }
Wortmann, Martin, Ashley Stephen Layland, Natalie Frese, Uwe Kahmann, Timo Grothe, Jan Lukas Storck, Tomasz Blachowicz, Jacek Grzybowski, Bruno Hüsgen, and Andrea Ehrmann. “On the Reliability of Highly Magnified Micrographs for Structural Analysis in Materials Science.” Scientific Reports 10 (2020). https://doi.org/10.1038/s41598-020-71682-8.
M. Wortmann et al., “On the reliability of highly magnified micrographs for structural analysis in materials science,” Scientific Reports, vol. 10, 2020.
Wortmann, Martin, et al. “On the Reliability of Highly Magnified Micrographs for Structural Analysis in Materials Science.” Scientific Reports, vol. 10, 14708, 2020, doi:10.1038/s41598-020-71682-8.
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2021-01-03T17:20:20Z


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